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Zero-Current Phenomena Analysis of the Single IGBT Open Circuit Faults in Two-Level and Three-Level SVGs
Ke Wang  Hong-Lu Zhao  Yi Tang  Xiao Zhang  Chuan-Jin Zhang

Vol. 18, No. 2, pp. 627-639, Mar. 2018
10.6113/JPE.2018.18.2.627

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  ISSN : 1598 - 2092
eISSN : 2093 - 4718